IMDEA Software researchers Facundo Molina, Juan Manuel Copia and Alessandra Gorla present FIXCHECK, a novel approach to improve patch fix analysis that combines static analysis, randomized testing and ...

In the world of embedded software development, defects can cripple projects, delay releases, and ultimately lead to failures that affect everything from consumer electronics to mission-critical ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...