Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

For a long time, semiconductor defect inspection focused on particles, and particle defects remain an important cause of yield loss. But as devices have become more complex, additional kinds of ...

High-performance electrodes for lithium-ion batteries can be improved by paying closer attention to their defects -- and capitalizing on them, according to scientists. High-performance electrodes for ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

Materials scientists have long known that introducing defects into three-dimensional materials can improve their mechanical and electronic properties. Now a new study finds how defects affect ...

AM operators are currently using SEM as a characterization tool for finished products. SEM offers high spatial resolution so the surface quality of the parts that are made using AM processes can be ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...

Design teams—whether using fabless, fablite, or IDM(integrated-device-manufacturer) processes—should handle the goal of reducing a design’ssensitivity to manufacturing issues. The furtherdownstream a ...

Fastmicro B.V. is a manufacturer of surface particle defect detection systems and equipment established over 15 years ago. The main product lines include sample surface particle defect scanning, ...