TESCAN AMBER is designed with a focus on versatility, covering both sample characterization at the nanoscale, and everyday FIB applications in the materials research lab. The synergy of its field free ...
Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...
A comprehensive scanning electron microscopy (SEM) analysis necessitates high-quality specimen preparation. Traditional mechanical sample preparation techniques, such as grinding, polishing, ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
SEMs are capable of imaging many different sample types including semiconductors, metals and alloys, polymers, ceramics and biological samples. Some samples can be more difficult to image and must be ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback