Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Researchers can now detect the formation of keyhole pores, one of the most challenging defects common in additive manufacturing, with incredible accuracy. A research team led by Tao Sun, associate ...
The Southern Maryland Chronicle on MSN
How are QA teams using machine learning to predict test failures in real time?
QA teams now use machine learning to analyze past test data and code changes to predict which tests will fail before they run. The technology examines patterns from previous test runs, code commits, ...
Machine learning is a subfield of artificial intelligence, which explores how to computationally simulate (or surpass) humanlike intelligence. While some AI techniques (such as expert systems) use ...
Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...
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