Carbon nanotube atomic force microscopy probes represent a significant advancement in nanoscale imaging and surface characterisation. Owing to the exceptional mechanical strength, high aspect ratio ...
Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...
Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...
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