The founding team of CEO Sophia Millar, Chief Technical Officer George Hallo, and Chief Product Officer Hooman Piroux ...

Metrology is the science of measuring, characterizing, and analyzing materials. Within metrology, there are several technologies used to detect material defects on a very small scale – precision on ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...

Researchers have devised and tested a new, highly sensitive method of detecting and counting defects in transistors -- a matter of urgent concern to the semiconductor industry as it develops new ...

The main objective of this project is to let students apply the image processing techniques that been taught in class in a given conditions based on their title. This particular project involved the ...

The size and performance advantages of FinFETs are leading to a general industry adoption of these 3D transistors at the more advanced technology nodes. These complex transistors, however, exacerbate ...

Flammable gas leaks continue to pose a real threat to workers and assets across the process industry. Gas and flame detection provide an early warning against this risk. But no single detection ...

Researchers have revived and improved a once-reliable technique to identify and count defects in transistors, the building blocks of modern electronic devices such as smartphones and computers.