Figure 1: Model of rotational defect in graphene and TMDs. In the following, we present observations of such rotational defects. By combing scanning TEM (STEM) experiments with first-principles ...

Semiconductor manufacturing creates a wealth of data – from materials, products, factory subsystems and equipment. But how do we best utilize that information to optimize processes and reach the goal ...

The concept of zero defect manufacturing has been around for decades, arising first in the aerospace and defense industry. Since then, this manufacturing approach has been adopted by the automotive ...

Failure analysis typically begins with identifying a region of interest (ROI) on a sample for detailed examination using tools such as a Scanning Electron Microscope (SEM), Focused Ion Beam (FIB), or ...