Several vendors are ramping up new inspection equipment based on infrared, optical, and X-ray technologies in an effort to reduce defects in current and future IC packages. While all of these ...

Catching all defects in chip packaging is becoming more difficult, requiring a mix of electrical tests, metrology screening, and various types of inspection. And the more critical the application for ...

This paper presents serial cardiac-catheterization data showing spontaneous functional closure of large symptomatic defects in 3 infants. One had an associated moderate-sized patent ductus arteriosus ...

Birth defects, that is anomalies that are present at the birth of the baby, can be structural, functional or metabolic; they can be detected during pregnancy or at birth; they can cause physical or ...