Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...
Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
Congenital heart defects (abnormalities of the heart that are present at birth) are the most common type of birth defect and, according to the Centers for Disease Control and Prevention, about 1 in 4 ...
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