Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

The novel technique is based on the VarifocalNet deep-learning object detection framework, which was reportedly tweaked to achieve quicker and more accurate results. Compared to other such methods, ...

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Leak detection plays a critical role in ensuring packaging reliability, especially in industries where product integrity directly affects safety, sterility or shelf life.