The use of hierarchical DFT methods is growing as design size and complexity stresses memory requirements and design schedules. Hierarchical DFT divides the design into smaller pieces, creates test ...

Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...

Through generations of technology advances, I’ve seen that as a particular task gets more important and usually more complex, it becomes the target of automation and so becomes greatly simplified.

The reality of DFT for large and complex SoCs has introduced new risk into design schedules. DFT teams end up in the critical path to tape out while waiting for portions of the design to be complete, ...

Design-for-test (DFT) is essential to ensure that complex designs can be thoroughly tested. Testing demands continue to increase as designs grow in gate count and fabrication process technologies ...

One significant design challenge for today’s SoCs is managing the impact of the very large design size on EDA tools and flows. Front-end and back-end design flows have managed this challenge by ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

As gate counts continue to swell at a rapid pace, modern systems-on-chip (SoCs) are increasingly integrating more design-for-testability (DfT) capabilities 1. Test and diagnosis of complex integrated ...

Get an overview of design patterns, then use what you've learned to evaluate whether the Composite pattern is a good choice for a particular Java use case Numerous strategies have been devised to ...